Cusp relations for local strongly decaying properties in electronic systems
dc.contributor.author | Liu, Shubin | |
dc.contributor.author | Parr, Robert G. | |
dc.contributor.author | Nagy, Ágnes | |
dc.date.accessioned | 2013-06-04T09:51:55Z | |
dc.date.available | 2013-06-04T09:51:55Z | |
dc.date.issued | 1995 | |
dc.date.pasync | 2018-01-27T01:30:19Z | |
dc.date.updated | 2018-01-27T01:30:19Z | |
dc.identifier.citation | Physical review. A. - 52 (1995), p. 2645-2651. -Phys. Rev. A. - 1050-2947 | |
dc.identifier.issn | 1050-2947 | |
dc.identifier.opac | http://webpac.lib.unideb.hu:8082/ebib/CorvinaWeb?action=cclfind&resultview=long&ccltext=idno+bibKLT00100634 | hu |
dc.identifier.original | http://journals.aps.org/pra/pdf/10.1103/PhysRevA.52.2645 | |
dc.identifier.uri | http://hdl.handle.net/2437/170179 | |
dc.language | eng | |
dc.rights.access | open access journal | |
dc.rights.owner | American Physical Society | |
dc.subject.mab | Természettudományok | |
dc.subject.mab | Fizikai tudományok | |
dc.title | Cusp relations for local strongly decaying properties in electronic systems | |
dc.type | folyóiratcikk |
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